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Homepage>UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
sklademVydáno: 2004-03-18
UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

UNE EN 60749-36:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 36: Aceleración constante.

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Označení normy:UNE EN 60749-36:2004
Počet stran:15
Vydáno:2004-03-18
Status:Norma
DESCRIPTION

This standard UNE EN 60749-36:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state is classified in these ICS categories:

  • 31.080.01
Categories:
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