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Homepage>UNE EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)
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sklademVydáno: 2008-07-01
UNE EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)

UNE EN 60749-37:2008

Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 37: Método de ensayo de caida a nivel de tarjeta para componentes usando un acelerómetro. (Ratificada por AENOR en julio de 2008.)

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Označení normy:UNE EN 60749-37:2008
Počet stran:23
Vydáno:2008-07-01
Status:Norma
DESCRIPTION

This standard UNE EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.) is classified in these ICS categories:

  • 31.080.01
Categories:
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