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Homepage>UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
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sklademVydáno: 2008-09-01
UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)

UNE EN 60749-38:2008

Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 38: Método de ensayo del error transitorio para dispositivos semiconductores con memoria. (Ratificada por AENOR en septiembre de 2008.)

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Označení normy:UNE EN 60749-38:2008
Počet stran:16
Vydáno:2008-09-01
Status:Norma
DESCRIPTION

This standard UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.) is classified in these ICS categories:

  • 31.080.01
Categories:
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