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Homepage>UNE EN 60749-40:2011 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)

UNE EN 60749-40:2011

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 40: Método de ensayo de caída al nivel de la plataforma mediante la utilización de galgas extensométricas (Ratificada por AENOR en noviembre de 2011.)

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Označení normy:	UNE EN 60749-40:2011
Počet stran:	26
Vydáno:	2011-11-01
Status:	Norma

DESCRIPTION

This standard UNE EN 60749-40:2011 Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.) is classified in these ICS categories:

31.080.01

Categories:

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