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Homepage>UNE EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)

UNE EN 60749-42:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 42: Almacenamiento en temperatura y humedad (Ratificada por AENOR en noviembre de 2014.)

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Označení normy:	UNE EN 60749-42:2014
Počet stran:	12
Vydáno:	2014-11-01
Status:	Norma

DESCRIPTION

This standard UNE EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.) is classified in these ICS categories:

31.080.01

Categories:

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