PRICES include / exclude VAT
sklademVydáno: 2011-12-01
UNE EN 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 7: Medición del contenido de humedad interna y análisis de otros gases residuales. (Ratificada por AENOR en diciembre de 2011.)
Format
Availability
Price and currency
Anglicky PDF
Immediate download
68.95 €
Anglicky Hardcopy
In stock
68.95 €
| Označení normy: | UNE EN 60749-7:2011 |
| Počet stran: | 14 |
| Vydáno: | 2011-12-01 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.) is classified in these ICS categories:
- 31.080.01
Categories: