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Homepage>UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)

UNE EN 60749-7:2011

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 7: Medición del contenido de humedad interna y análisis de otros gases residuales. (Ratificada por AENOR en diciembre de 2011.)

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Označení normy:	UNE EN 60749-7:2011
Počet stran:	14
Vydáno:	2011-12-01
Status:	Norma

DESCRIPTION

This standard UNE EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.) is classified in these ICS categories:

31.080.01

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