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Homepage>UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
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sklademVydáno: 2008-09-01
UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)

UNE EN 61967-6:2002/A1:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas de 150 kHz a 1 GHz. Parte 6: Mediciones de emisiones conducidas. Método de sonda magnética. (Ratificada por AENOR en septiembre de 2008.)

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Označení normy:UNE EN 61967-6:2002/A1:2008
Počet stran:23
Vydáno:2008-09-01
Status:Změna
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This standard UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.) is classified in these ICS categories:

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