Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>UNE EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
sklademVydáno: 2011-12-01
UNE EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)

UNE EN 62047-10:2011

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)

Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 10: Ensayo de compresión de los micropilares en materiales MEMS. (Ratificada por AENOR en diciembre de 2011.)

Format
Availability
Price and currency
Anglicky PDF
Immediate download
68.02 €
Anglicky Hardcopy
In stock
68.02 €
Označení normy:UNE EN 62047-10:2011
Počet stran:15
Vydáno:2011-12-01
Status:Norma
DESCRIPTION

This standard UNE EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.) is classified in these ICS categories:

  • 31.080.99
Categories: