PRICES include / exclude VAT
Sponsored link
sklademVydáno: 2012-06-01
UNE EN 62047-13:2012
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 13: Métodos de medición del ensayo tipo de resistencia adhesiva al curvado y cizallamiento para estructuras MEMS (Ratificada por AENOR en junio de 2012.)
Format
Availability
Price and currency
Anglicky PDF
Immediate download
72.19 €
Anglicky Hardcopy
In stock
72.19 €
| Označení normy: | UNE EN 62047-13:2012 |
| Počet stran: | 18 |
| Vydáno: | 2012-06-01 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 62047-13:2012 Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.) is classified in these ICS categories:
- 31.080.99
Categories: