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sklademVydáno: 2012-06-01
UNE EN 62047-14:2012
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
Dispositivos semiconductores. Dispositivos microelectromecánicos. Parte 14: Método de medición del límite de formación de los materiales de película metálica. (Ratificada por AENOR en junio de 2012.)
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| Označení normy: | UNE EN 62047-14:2012 |
| Počet stran: | 21 |
| Vydáno: | 2012-06-01 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 62047-14:2012 Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.) is classified in these ICS categories:
- 31.080.99
Categories: