Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
Sponsored link
sklademVydáno: 2007-01-01
UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)

UNE EN 62047-2:2006

Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)

Dispositivos semiconductores. Parte 2: Dispositivos micro-electromecánicos. Métodos de ensayo de tensión de materiales de película fina (IEC 62047-2:2006). (Ratificada por AENOR en enero de 2007.)

Format
Availability
Price and currency
Anglicky PDF
Immediate download
70.80 €
Anglicky Hardcopy
In stock
70.80 €
Označení normy:UNE EN 62047-2:2006
Počet stran:17
Vydáno:2007-01-01
Status:Norma
DESCRIPTION

This standard UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.) is classified in these ICS categories:

  • 31.080.99
Categories:
Print