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Homepage>UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)

UNE EN 62047-22:2014

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)

Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 22: Métodos de ensayo de tensión electromecánica para películas delgadas conductoras sobre sustratos flexibles (Ratificada por AENOR en noviembre de 2014.)

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Označení normy:	UNE EN 62047-22:2014
Počet stran:	14
Vydáno:	2014-11-01
Status:	Norma

DESCRIPTION

This standard UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.) is classified in these ICS categories:

01.080.99
31.080.99

Categories:

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