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Homepage>UNE EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
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sklademVydáno: 2007-01-01
UNE EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)

UNE EN 62047-3:2006

Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)

Dispositivos semiconductores. Parte 3: Dispositivos micro-electromecánicos. Pieza de ensayo patrón de película fina para ensayo de tensión (IEC 62047-3:2006) (Ratificada por AENOR en enero de 2007.)

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Označení normy:UNE EN 62047-3:2006
Počet stran:12
Vydáno:2007-01-01
Status:Norma
DESCRIPTION

This standard UNE EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.) is classified in these ICS categories:

  • 31.080.99
Categories:
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