PRICES include / exclude VAT
Sponsored link
sklademVydáno: 2010-06-01
UNE EN 62047-6:2010
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 4: Métodos de ensayo de la fatiga axial de los materiales de película. (Ratificada por AENOR en junio de 2010.)
Format
Availability
Price and currency
Anglicky PDF
Immediate download
74.59 €
Anglicky Hardcopy
In stock
74.59 €
| Označení normy: | UNE EN 62047-6:2010 |
| Počet stran: | 19 |
| Vydáno: | 2010-06-01 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.) is classified in these ICS categories:
- 31.080.99
Categories: