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sklademVydáno: 2011-09-01
UNE EN 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 8: Métodos de ensayo de curvado en banda la medida de propiedades de tensión de las películas finas(Ratificada por AENOR en septiembre de 2011.)
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| Označení normy: | UNE EN 62047-8:2011 |
| Počet stran: | 21 |
| Vydáno: | 2011-09-01 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.) is classified in these ICS categories:
- 31.080.99
Categories: