PRICES include / exclude VAT

Homepage>UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

UNE EN 62374-1:2010

Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

Dispositivos semiconductores. Ensayo de ruptura dieléctrica dependiente del tiempo (TDDB) para capas intermetálicas (Ratificada por AENOR en marzo de 2011.)

Anglicky PDF

Immediate download

75.60 €

Anglicky Hardcopy

In stock

75.60 €

Označení normy:	UNE EN 62374-1:2010
Počet stran:	19
Vydáno:	2011-03-01
Status:	Norma

DESCRIPTION

This standard UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.) is classified in these ICS categories:

31.080

Categories:

Print RECOMMEND