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Homepage>UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
sklademVydáno: 2011-03-01
UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

UNE EN 62374-1:2010

Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

Dispositivos semiconductores. Ensayo de ruptura dieléctrica dependiente del tiempo (TDDB) para capas intermetálicas (Ratificada por AENOR en marzo de 2011.)

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Označení normy:UNE EN 62374-1:2010
Počet stran:19
Vydáno:2011-03-01
Status:Norma
DESCRIPTION

This standard UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.) is classified in these ICS categories:

  • 31.080
Categories:
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