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Homepage>UNE EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
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sklademVydáno: 2010-09-01
UNE EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

UNE EN 62417:2010

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

Dispositivos semiconductores. Ensayos de iones móviles para transistores de semiconductores de óxido metálico de efecto de campo (MOSFET) (Ratificada por AENOR en septiembre de 2010.)

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Označení normy:UNE EN 62417:2010
Počet stran:11
Vydáno:2010-09-01
Status:Norma
DESCRIPTION

This standard UNE EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.) is classified in these ICS categories:

  • 31.080.01
Categories:
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