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32575 results
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UNE EN 61988-2-3:2009
Plasma display panels -- Part 2-3: Measuring methods - Image quality: defects and degradation (Endorsed by AENOR in March of 2010.)
Vydáno: 2010-03-01
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UNE EN 61988-5:2009
Plasma display panels -- Part 5: Generic specification (Endorsed by AENOR in April of 2010.)
Vydáno: 2010-04-01
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UNE EN 61996-2:2008
Maritime navigation and radiocommunication equipment and systems- Shipborne voyage data recorder (VDR)- Part 2: Simplified voyage data recorder (S-VDR)- Performance requirements, methods of testing and required test results (Endorsed by AENOR in November of 2008.)
Vydáno: 2008-11-01
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UNE EN 62007-1:2015
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (Endorsed by AENOR in August of 2015.)
Vydáno: 2015-08-01
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UNE EN 62012-1:2002
Multicore and symmetrical pair/quad cables for digital communications to be used in harsh environments -- Part 1: Generic specification (Endorsed by AENOR in March of 2003.)
Vydáno: 2003-03-01
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UNE EN 62028:2004
General methods of measurement for digital television receivers (Endorsed by AENOR in May of 2004.)
Vydáno: 2004-05-01
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UNE EN 62047-11:2013
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (Endorsed by AENOR in November of 2013.)
Vydáno: 2013-11-01
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UNE EN 62047-14:2012
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
Vydáno: 2012-06-01
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UNE EN 62047-18:2013
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)
Vydáno: 2013-11-01
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UNE EN 62047-26:2016
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)
Vydáno: 2016-06-01
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UNE EN 62047-3:2006
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
Vydáno: 2007-01-01
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UNE EN 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
Vydáno: 2011-09-01
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32575 results
First page123...233523372339...271327142715Last page