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32634 results
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UNE EN 62002-2:2008
Mobile and portable DVB-T/H radio access - Part 2: Interface conformance testing (Endorsed by AENOR in April of 2009.)
Vydáno: 2009-04-01
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UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Vydáno: 2009-06-01
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UNE EN 62022:2007
Installed monitors for the control and detection of gamma radiations contained in recyclable or non-recyclable materials transported by vehicles (IEC 62022:2004). (Endorsed by AENOR in December of 2007.)
Vydáno: 2007-12-01
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UNE EN 62023:2012
Structuring of technical information and documentation (Endorsed by AENOR in March of 2012.)
Vydáno: 2012-03-01
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UNE EN 62026-2:2013/A1:2019
Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 2: Actuator sensor interface (AS-i) (Endorsed by Asociación Española de Normalización in January of 2020.)
Vydáno: 2020-01-01
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UNE EN 62047-10:2011
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
Vydáno: 2011-12-01
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UNE EN 62047-12:2011
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (Endorsed by AENOR in February of 2012.)
Vydáno: 2012-02-01
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UNE EN 62047-16:2015
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films – Wafer curvature and cantilever beam deflection methods (Endorsed by AENOR in August of 2015.)
Vydáno: 2015-08-01
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UNE EN 62047-21:2014
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (Endorsed by AENOR in November of 2014.)
Vydáno: 2014-11-01
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UNE EN 62047-7:2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (Endorsed by AENOR in November of 2011.)
Vydáno: 2011-11-01
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UNE EN 62047-9:2011
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (Endorsed by AENOR in June of 2012.)
Vydáno: 2012-06-01
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UNE EN 62056-5-3:2017
Electricity metering data exchange - The DLMS/COSEM suite - Part 5-3: DLMS/COSEM application layer (Endorsed by Asociación Española de Normalización in December of 2017.)
Vydáno: 2017-12-01
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32634 results
First page123...693695697...271827192720Last page