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Hlavní stránka>IEC 60749-12:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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sklademVydáno: 2017-12-13
IEC 60749-12:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables

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Anglicky/Francouzsky Tisk
skladem
572 Kč
Anglicky/Francouzsky PDF
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Označení normy:IEC 60749-12:2017
Vydáno:2017-12-13
Jazyk:Anglicky/Francouzsky
Popis

IEC 60749-12:2017

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

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