Cena s DPH / bez DPH
sklademVydáno: 2002-08-30
IEC 60749-31:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 31: Inflammabilité des dispositifs à encapsulation plastique (cas d'une cause interne d'inflammation)
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Anglicky/Francouzsky Tisk
skladem
572 Kč
Anglicky/Francouzsky PDF
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572 Kč
| Označení normy: | IEC 60749-31:2002 |
| Vydáno: | 2002-08-30 |
| Jazyk: | Anglicky/Francouzsky |
Popis
IEC 60749-31:2002
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.