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Hlavní stránka>IEC 60749-33:2004 - Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
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sklademVydáno: 2004-03-09
IEC 60749-33:2004 - Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

IEC 60749-33:2004

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 33: Résistance à l'humidité accélérée - Autoclave sans polarisation

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Anglicky/Francouzsky Tisk
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Označení normy:IEC 60749-33:2004
Vydáno:2004-03-09
Jazyk:Anglicky/Francouzsky
Popis

IEC 60749-33:2004

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

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