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sklademVydáno: 2006-08-15
IEC 62047-3:2006
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 3: Eprouvette d'essai normalisée en couche mince pour l'essai de traction
Formát
Dostupnost
Cena a měna
Anglicky/Francouzsky Tisk
skladem
598 Kč
Anglicky/Francouzsky PDF
K okamžitému stažení
598 Kč
Označení normy: | IEC 62047-3:2006 |
Vydáno: | 2006-08-15 |
Jazyk: | Anglicky/Francouzsky |
Popis
IEC 62047-3:2006
Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.