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Hlavní stránka>IEC 62951-2:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
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sklademVydáno: 2019-04-17
IEC 62951-2:2019 - Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

IEC 62951-2:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 2 : Méthode d’évaluation pour la mobilité des électrons, la pente en régime de sous-seuil et la tension de seuil des dispositifs souples

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Anglicky/Francouzsky Tisk
skladem
1144 Kč
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1144 Kč
Označení normy:IEC 62951-2:2019
Vydáno:2019-04-17
Jazyk:Anglicky/Francouzsky
Popis

IEC 62951-2:2019

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.