Cena s DPH / bez DPH
sklademVydáno: 2019-02-27
IEC 62951-4:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 4: Evaluation de la fatigue pour les couches minces conductrices souples sur les substrats pour dispositifs à semiconducteurs souples
Formát
Dostupnost
Cena a měna
Anglicky/Francouzsky Tisk
skladem
2288 Kč
Anglicky/Francouzsky PDF
K okamžitému stažení
2288 Kč
| Označení normy: | IEC 62951-4:2019 |
| Vydáno: | 2019-02-27 |
| Jazyk: | Anglicky/Francouzsky |
Popis
IEC 62951-4:2019
IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.