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Hlavní stránka>IEC TS 61994-4-4:2018 RLV - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
sklademVydáno: 2018-11-16
IEC TS 61994-4-4:2018 RLV - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

IEC TS 61994-4-4:2018 RLV

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

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Označení normy:IEC TS 61994-4-4:2018 RLV
Vydáno:2018-11-16
Jazyk:Anglicky
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IEC TS 61994-4-4:2018 RLV

IEC TS 61994-4-4:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61994-4-4:2018 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. This edition includes the following significant technical changes with respect to the previous edition: - the new terms and definitions given in IEC 62276:2016 have been taken into account; - the general title has been changed according to the change in the title of TC 49 in 2009. - the part title has been changed according to the title of IEC 62276:2016.

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