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sklademVydáno: 2004
ISO 21270:2004
ISO 21270:2004-Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
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| Označení normy: | ISO 21270:2004 |
| Počet stran: | 13 |
| Vydání: | 1 |
| Vydáno: | 2004 |
| Jazyk: | Anglicky |
Popis
ISO 21270:2004
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.