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71.040.40 Chemická analýza
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BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Vydáno: 2015-11-30
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PD ISO/TR 19693:2018
Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
Vydáno: 2018-02-28
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Vydáno: 2015-10-31
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BS EN ISO 6145-4:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Continuous syringe injection method
Vydáno: 2009-02-28
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BS ISO 13424:2013
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
Vydáno: 2013-10-31
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BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Vydáno: 2017-01-31
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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
Vydáno: 1983-01-31
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BS EN 61207-7:2013
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers
Vydáno: 2015-07-31
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Vydáno: 2010-11-30
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