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První stranaPředchozí strana123...5859606162...933934935DalšíPoslední stranaIEC TR 62453-51-20:2017
Field device tool (FDT) interface specification - Part 51-20: Communication implementation for common object model - IEC 61784 CPF 2
Field device tool (FDT) interface specification - Part 51-20: Communication implementation for common object model - IEC 61784 CPF 2
Vydáno: 2017-06-15
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IEC 62715-6-1:2018
Flexible display devices - Part 6-1: Mechanical test methods - Deformation tests
Flexible display devices - Part 6-1: Mechanical test methods - Deformation tests
Vydáno: 2018-04-20
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IEC 60749-32:2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Vydáno: 2002-08-30
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IEC 60761-5:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Vydáno: 2002-01-16
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3289 Kč
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IEC 60754-2:2011
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Vydáno: 2011-11-17
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IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Vydáno: 2004-03-09
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IEC 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Vydáno: 2011-04-07
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IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Vydáno: 2003-02-13
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IEC 60749-8:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Vydáno: 2002-08-30
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11218 Výsledky
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