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Hlavní stránka>PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry
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sklademVydáno: 2011-11-30
PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

PD CEN/TR 10353:2011

Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

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Označení normy:PD CEN/TR 10353:2011
Počet stran:34
Vydáno:2011-11-30
ISBN:978 0 580 73228 7
Status:Standard
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PD CEN/TR 10353:2011


This standard PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry is classified in these ICS categories:
  • 77.080.10 Irons

This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in ferro-silicon materials.

The method is applicable to:

  • Al contents between 0,2 and 2 %;

  • Ti contents between 0,02 and 0,25 %;

  • P contents between 0,005 and 0,05 %.

The procedure is valid for the analytical lines given in Table 1. This table also gives, for each line, the spectral interferences, which shall be corrected.

NOTE The interferences extent as well as other possible interferences depend on the temperature in the plasma and on the optical resolution of the spectrometer used.

Table 1 — Spectral lines recommended together with the interferences which shall be corrected

Element Wavelength (nm) Interferences
Al 308,22 V
Ti 337,28 V, Ni
P 178,29 Mo