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Hlavní stránka>UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
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sklademVydáno: 2007-01-01
UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)

UNE EN 62047-2:2006

Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)

Dispositivos semiconductores. Parte 2: Dispositivos micro-electromecánicos. Métodos de ensayo de tensión de materiales de película fina (IEC 62047-2:2006). (Ratificada por AENOR en enero de 2007.)

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Označení normy:UNE EN 62047-2:2006
Počet stran:17
Vydáno:2007-01-01
Status:Norma
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This standard UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.) is classified in these ICS categories:

  • 31.080.99
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